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PUYA P25Q40H-TSH-IR product image
  • P25Q40H-TSH-IR thumbnail 1
  • P25Q40H-TSH-IR thumbnail 2
  • P25Q40H-TSH-IR thumbnail 3
  • Pinout Diagram
  • Footprint Diagram
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PUYA P25Q40H-TSH-IRRoHS

Manufacturer
PUYAAsian Brands
MPN
P25Q40H-TSH-IR
LCSC Part #
C414066
Packaging
TSSOP-8
Customer #
Key Attributes
Ultra Low Power, Serial Multi I/O Flash Memory
Datasheetpdf iconPUYA P25Q40H-TSH-IR
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Products Specifications

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TypeDescription
CategoryIntegrated Circuits (ICs)/Memory/Memory (ICs)
ManufacturerPUYA
PackagingTSSOP-8
Memory Size4Mbit
Voltage - Supply2.3V~3.6V
Operating temperature-40℃~+85℃
Program / Erase Cycles100,000 cycles
Clock Frequency85MHz
FeaturesWrite enable latch;Power-on reset;Hardware write protection;Software write protection
Data Retention - TDR (Year)20 Years
Block Erase Time(tBE)8ms
Write Cycle Time(tWC)12ms
Page Programming Time (Tpp)2ms
Standby Supply Current9uA
InterfaceSPI

Additional Information

TypeDetails
Minimum5
Multiple5
Standard Packaging4000
Sales UnitPiece

Introduction

AI Translation

The P25Q40H/20H/10H/05H is a serial interface Flash memory device designed for use in a wide variety of high-volume consumer based applications in which program code is shadowed from Flash memory into embedded or external RAM for execution. The flexible erase architecture of the device, with its page erase granularity it is ideal for data storage as well, eliminating the need for additional data storage devices. The erase block sizes of the device have been optimized to meet the needs of today's code and data storage applications. By optimizing the size of the erase blocks, the memory space can be used much more efficiently. Because certain code modules and data storage segments must reside by themselves in their own erase regions, the wasted and unused memory space that occurs with large sectored and large block erase Flash memory devices can be greatly reduced. This increased memory space efficiency allows additional code routines and data storage segments to be added while still maintaining the same overall device density. The device also contains an additional 3*512 -byte security registers with OTP lock (One-Time Programmable), can be used for purposes such as unique device serialization, system-level Electronic Serial Number (ESN) storage, locked key storage, etc. Specifically designed for use in many different systems, the device supports read, program, and erase operations with a wide supply voltage range of 2.3V to 3.6V. No separate voltage is required for programming and erasing.

Features

AI Translation
  • Wide Supply Range from 2.3 to 3.6V for Read, Erase and Program
  • Ultra Low Power consumption for Read, Erase and Program
  • X1, X2 and X4 Multi I/O Support
  • High reliability with 100K cycling and 20 Year-retention
  • Single 2.30V to 3.60V supply
  • Industrial Temperature Range -40C to 85C
  • Serial Peripheral Interface (SPI) Compatible: Mode 0 and Mode 3
  • Single, Dual and Quad IO mode
  • 4M/2M/1M/512K x 1 bit
  • 2M/1M/512K/256K x 2 bits
  • 1M/512K/256K/128K x 4 bits
  • Flexible Architecture for Code and Data Storage
  • Uniform 256-byte Page Program
  • Uniform 256-byte Page Erase
  • Uniform 4K-byte Sector Erase
  • Uniform 32K/64K-byte Block Erase
  • Full Chip Erase
  • Hardware Controlled Locking of Protected Sectors by WP Pin
  • 2ms Page program time
  • 8ms Page erase time
  • 8ms 4K-byte sector erase time
  • 8ms 32K-byte block erase time
  • 8ms 64K-byte block erase time
  • JEDEC Standard Manufacturer and Device ID Read Methodology
  • Ultra Low Power Consumption
  • 0.6uA Deep Power Down current
  • 9uA Standby current
  • 2.5mA Active Read current at 33MHz
  • 3.0mA Active Program or Erase current
  • High Reliability 100,000 Program / Erase Cycles
  • 20-year Data Retention
  • Industry Standard Green Package Options
  • 8-pin SOP8 (150mil/208mil)
  • 8-land USON8 (3x2x0.55mm), (3x2x0.45mm), (3x4x0.55mm)
  • 8-land WSON8 (6x5x0.75mm)
  • 8-pin TSSOP8
  • WLCSP
  • KGD for SiP