PUYA P25Q64H-SUH-IT

The P25Q64H is a serial interface Flash memory device designed for use in a wide variety of high-volume consumer based applications in which program code is shadowed from Flash memory into embedded or external RAM for execution. The flexible erase architecture of the device, with its page erase granularity it is ideal for data storage as well, eliminating the need for additional data storage devices.

The erase block sizes of the device have been optimized to meet the needs of today's code and data storage applications. By optimizing the size of the erase blocks, the memory space can be used much more efficiently. Because certain code modules and data storage segments must reside by themselves in their own erase regions, the wasted and unused memory space that occurs with large sectored and large block erase Flash memory devices can be greatly reduced. This increased memory space efficiency allows additional code routines and data storage segments to be added while still maintaining the same overall device density.

The device also contains an additional 3 * 1024-byte security registers with OTP lock (One-Time Programmable), can be used for purposes such a

• Wide Supply Range from 2.3 to 3.6V for Read, Erase and Program
• Ultra Low Power consumption for Read, Erase and Program
• X1, X2 and X4 Multi I/O, QPI Support
• High reliability with 100K cycling and 20 Year-retention
• Single 2.3V to 3.60V supply
• Industrial Temperature Range -40C to 85C
• Serial Peripheral Interface (SPI) Compatible: Mode 0 and Mode 3
• Single, Dual, Quad SPI, QPI
• Standard SPI: SCLK,CS#,SI,SO,WP#,HOLD#
• Dual SPI: SCLK,CS#,IO0,IO1,WP#, HOLD#
• Quad SPI: SCLK,CS#,IO0,IO1,IO2,IO3
• QPI: SCLK,CS#,IO0,IO1,IO2,IO3
• Flexible Architecture for Code and Data Storage
• Uniform 256-byte Page Program
• Uniform 256-byte Page Erase
• Uniform 4K-byte Sector Erase
• Uniform 32K/64K-byte Block Erase
• Full Chip Erase
• Hardware Controlled Locking of Protected Sectors by WP Pin
• 128 bit unique ID for each device
• Fast Program and Erase Speed
• 2ms Page program time
• 10ms Page erase time
• 10ms 4K-byte sector erase time
• 10ms 32K-byte block erase time
• 10ms 64K-byte block erase time
• JEDEC Standard Manufacturer and Device ID Read Methodology
• Ultra Low Power Consumption
• 1.0uA Deep Power Down current
• 18uA Standby current
• 2.5mA Active Read current at 33MHz
• 5.0mA Active Program or Erase current
• High Reliability 100,000 Program / Erase Cycles
• 20-year Data Retention
• Industry Standard Green Package Options
• 8-pin SOP (150mil/208mil)
• 8-land WSON (6x5x0.75mm)
• 24-ball TFBGA
• WLCSP
• KGD for SiP