TI PGA855RGTR

The PGA855 is a high-bandwidth programmable gain instrumentation amplifier with fully differential outputs. The PGA855 is equipped with eight binary gain settings, from an attenuating gain of 0.125 V/V to a maximum of 16 V/V, using three digital gain selection pins. The output common-mode voltage can be independently set using the VOCM pin. The PGA855 architecture is optimized to drive inputs of high-resolution, precision analog-to-digital converters (ADCs) with sampling rates up to 1 MSPS without the need for an additional ADC driver. The output-stage power supplies (LVSS/LVDD) are decoupled from the input stage and can be connected to power supplies of the ADC to protect the ADC or downstream device against overdrive damage. The super-beta input transistors offer an impressively low input bias current, which in turn provides a very low input current noise density of 0.3 pA/√Hz, making the PGA855 a versatile choice for virtually any sensor type. The low-noise current-feedback front-end architecture offers excellent gain flatness, even at high frequencies, making the PGA855 an excellent high-impedance sensor readout device. Integrated protection circuitry on the input pins handles overvoltages up to ±40 V beyond the powersupply voltages.

• Eight pin-programmable binary gains: G (V/V) = 1/8, 1/4, 1/2, 1, 2, 4, 8, and 16
• Low gain error drift: 1 ppm/°C (max) at G = 1 V/V
• Fully differential outputs
• Independent output power-supply pins to allow for ADC input overdrive protection
• Output common-mode control
• Faster signal processing: Wide bandwidth: 10 MHz at all gains
• High slew rate: 35 V/μs
• Settling time: 500 ns to 0.01%, 950 ns to 0.0015%
• Input stage noise: 7.8 nV/√Hz at G = 16 V/V
• Filter option to achieve better SNR
• Input overvoltage protection to ±40 V beyond supplies
• Input-stage supply range: Single supply: 8 V to 36 V; Dual supply: ±4 V to ±18 V
• Output-stage supply range: Single supply: 4.5 V to 36 V; Dual supply: ±2.25 V to ±18 V
• Specified temperature range: -40°C to +125°C
• Small package: 3-mm × 3-mm VQFN

• Factory automation and control
• Analog input module
• Data acquisition (DAQ)
• Test and measurement
• Semiconductor test