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MICROCHIP 1N4702UR-1/TR product image
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MICROCHIP 1N4702UR-1/TR

Manufacturer
MPN
1N4702UR-1/TR
LCSC Part #
C3740147
Packaging
DO-213AA
Customer #
Key Attributes
1 Independent 15V DO-213AA Single Zener Diodes RoHS
Datasheetpdf iconMICROCHIP 1N4702UR-1/TR
RoHS Compliance2 documents available
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QtyUnit Price(Reference Only)Total Amount
1+$ 5.5963$ 5.60
200+$ 2.1657$ 433.14
500+$ 2.0902$ 1045.10
1,000+$ 2.0531$ 2053.10
Standard Packaging264/Full Reel
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Products Specifications

All
TypeDescription
CategoryDiscrete Semiconductors/Diodes/Zener/Single Zener Diodes
ManufacturerMICROCHIP
PackagingDO-213AA
Diode Configuration1 Independent
Tolerance±5%
Operating Junction Temperature Range-65℃~+175℃
Pd - Power Dissipation500mW
Reverse Leakage Current (Ir)50nA@11.4V
Impedance(Zzt)-
Zener Voltage(Range)-
Zener Voltage(Nom)15V
Impedance(Zzk)-

Introduction

AI Translation

The 1N4678UR-1 through 1N4717UR-1 series are 0.5W glass surface mount DO-213AA Zener voltage regulators offering voltage selections from 1.8V to 43V. Standard tolerance is ±5%, with 1% and 2% options also available. Zener test current is only 50μA. Metal slugs clamping the die are metallurgically bonded to silicon for high reliability. This internally bonded Zener package construction is also available with high-reliability screening as described in the Characteristics section. Microsemi also offers many other Zener products to meet higher and lower power application requirements.

Features

AI Translation
  • Surface mount equivalent to JEDEC-registered 1N4678 through 1N4717 series.
  • Internal metallurgical bond.
  • Hermetic surface mount package.
  • Available in tighter 2% and 1% voltage tolerances.
  • Screenable to MIL-PRF-19500. (See part nomenclature for all available options.)
  • RoHS-compliant devices available (commercial grade only).

Applications

AI Translation
  • Voltage regulation across wide operating current and temperature ranges.
  • Voltage selection range: 1.8 to 43V.
  • Insensitive to ESD per MIL-STD-750 Method 1020.
  • Minimum capacitance.
  • Inherent radiation hardness as described in Microsemi's "MicroNote 050".