SILICON LABS C8051F570-IMR

12-bit ADC up to 200ksps, up to 32 external single-ended inputs, reference voltage (VREF) sourced from on-chip VREF, external pin, or VDD, conversion trigger selectable from internal or external source, built-in temperature sensor. Two comparators with programmable hysteresis and response time, configurable as interrupt or reset sources, low current consumption. On-chip debug circuit enables full-speed, non-intrusive in-system debugging (no emulator required), providing breakpoints, single-step execution, and inspect/modify memory and register functions — superior to emulation systems using ICE chips, target boards, and sockets — with low cost and a complete development kit. Supply voltage 1.8 to 5.25V, typical operating current 19mA at 50MHz, typical stop-mode current 1μA. High-speed 8051 MCU core with pipelined instruction architecture; 70% of instructions execute in 1 or 2 system clocks; throughput up to 50MIPS at 50MHz clock; extended interrupt handler. Memory: 2304 bytes internal data RAM (256 + 2048 XRAM), 32 or 16kB flash, in-system programmable in 512-byte sectors. Digital peripherals include 33, 25, or 18 port I/Os, all 5V-tolerant; CAN 2.0 controller (no crystal required), LIN 2.1 controller (master/slave mode, no crystal required), hardware-enhanced UART, SMBus, and enhanced SPI serial ports; four general-purpose 16-bit counter/timers; 16-bit programmable counter array (PCA) with six capture/compare modules and enhanced PWM functionality. Clock sources: internal 24MHz oscillator with ±0.5% accuracy, suitable for CAN and master LIN operation; external oscillator supports crystal, RC, C, or clock input (1 or 2-pin mode); dynamic clock switching useful in power-saving modes. Package options: 40-pin QFN (C8051F568-9 and 'F570-5), 32-pin QFP/QFN (C8051F560-7), 24-pin QFN (C8051F550-7). Automotive-grade compliant, temperature range -40 to +125°C, AEC-Q100 qualified.

• Up to 200ksps
• Up to 32 external single-ended inputs
• VREF from on-chip VREF, external pin or VDD
• Internal or external start of conversion source
• Built-in temperature sensor
• Two Comparators Programmable hysteresis and response time
• Configurable as interrupt or reset source
• Low current
• On-chip debug circuitry facilitates full speed, nonintrusive in-system debug (no emulator required)
• Provides breakpoints, single stepping, inspect/modify memory and registers
• Superior performance to emulation systems using ICE-chips, target pods, and sockets
• Low cost, complete development kit
• Supply Voltage 1.8 to 5.25V
• Typical operating current: 19 mA at 50 MHz
• Typical stop mode current: 1 μA
• Pipelined instruction architecture; executes 70% of instructions in 1 or 2 system clocks
• Up to 50 MIPS throughput with 50MHz clock
• Expanded interrupt handler
• 2304 bytes internal data RAM (256 + 2048 XRAM)
• 32 or 16 kB Flash; In-system programmable in 512-byte Sectors
• 33, 25, or 18 Port I/O; All 5V tolerant
• CAN 2.0 Controller—no crystal required
• LIN 2.1 Controller (Master and Slave capable); no crystal required
• Hardware enhanced UART, SMBus, and enhanced SPI serial ports
• Four general purpose 16-bit counter/timers
• 16-bit programmable counter array (PCA) with six capture/compare modules and enhanced PWM functionality
• Internal 24MHz with ±0.5% accuracy for CAN and master LIN operation
• External oscillator: Crystal, RC, C, or clock (1 or 2 pin modes)
• Can switch between clock sources on-the-fly; useful in power saving modes
• Temperature Range: -40 to +125 ℃
• Compliant to AEC-Q100