Infineon/CYPRESS CY7C1514KV18-250BZXC

The CY7C1510KV18, CY7C1525KV18, CY7C1512KV18, and CY7C1514KV18 are 1.8V Synchronous Pipelined SRAMs, equipped with QDR II architecture. QDR II architecture consists of two separate ports: the read port and the write port to access the memory array. The read port has dedicated data outputs to support read operations and the write port has dedicated data inputs to support write operations. QDR II architecture has separate data inputs and data outputs to completely eliminate the need to “turnaround” the data bus that exists with common I/O devices. Access to each port is through a common address bus. Addresses for read and write addresses are latched on alternate rising edges of the input (K) clock. Accesses to the QDR II read and write ports are completely independent of one another. To maximize data throughput, both read and write ports are equipped with DDR interfaces. Each address location is associated with two 8-bit words (CY7C1510KV18), 9-bit words (CY7C1525KV18), 18-bit words (CY7C1512KV18), or 36-bit words (CY7C1514KV18) that burst sequentially into or out of the device. Because data can be transferred into and out of the device on every rising edge of both input clocks (K and K and C and C), memory bandwidth is maximized while simplifying system design by eliminating bus turnarounds.

• Separate Independent Read and Write Data Ports
• Supports concurrent transactions
• 350 MHz Clock for High Bandwidth
• 2-word Burst on all Accesses
• Double Data Rate (DDR) Interfaces on both Read and Write Ports (data transferred at 700 MHz) at 350 MHz
• Two Input Clocks (K and K) for precise DDR Timing
• SRAM uses rising edges only
• Two Input Clocks for Output Data (C and C) to minimize Clock Skew and Flight Time mismatches
• Echo Clocks (CQ and CQ) simplify Data Capture in High Speed Systems
• Single Multiplexed Address Input bus latches Address Inputs for both Read and Write Ports
• Separate Port Selects for Depth Expansion
• Synchronous internally Self-timed Writes
• QDR II operates with 1.5 Cycle Read Latency when DOFF is asserted HIGH
• Operates similar to QDR I Device with 1 Cycle Read Latency when DOFF is asserted LOW
• Available in x8, x9, x18, and x36 Configurations
• Full Data Coherency, providing Most Current Data
• Core VDD = 1.8V (±0.1V); 1/0 VDDQ = 1.4V to VDD
• Supports both 1.5V and 1.8V I/O supply
• Available in 165-ball FBGA Package (13x15x1.4 mm)
• Offered in both Pb-free and non Pb-free Packages
• Variable Drive HSTL Output Buffers
• JTAG 1149.1 Compatible Test Access Port
• Phase Locked Loop (PLL) for Accurate Data Placement