huaxindianzi 2TS026000RP

This document describes the specifications for quartz crystal units. Under standard atmospheric conditions, the ambient temperature for measurement and testing is 25 ± 10℃, with relative humidity of 40%~70%; when in doubt, the ambient temperature is 25 ± 2℃ with the same relative humidity range. Electrical characteristics are measured using S&A 250B or equivalent equipment. The FT curve of AT-cut crystals can be modeled by a third-order polynomial, with the curve fitting parameters C0, C1, C2, and C3 ranges specified. Drive level dependency, GPS quality specifications (including crystal perturbation specifications 1 and 2), thermistor specifications, as well as dimensions, markings, and recommended reflow soldering profiles are also defined.

• Ambient temperature 25 ± 10℃, relative humidity 40%~70% under standard atmospheric conditions; when in doubt, ambient temperature 25 ± 2℃
• AT-cut crystal F-T curve modeled using third-order polynomial F(T) = C3(T - T0)³ + C2(T - T0)² + C1(T - T0) + C0
• C0: ±10 ppm, C1: -0.4 ~ -0.1 ppm/°C, C2: -4.5×10⁻⁴ ~ 4.5×10⁻⁴ ppm/°C², C3: 8.5×10⁻⁵ ~ 11.5×10⁻⁵ ppm/°C³
• Drive level dependency measurement: 29 total test points, ESR variation rate (max - min)/min < 20%, repeatability (ESR2 - ESR1)/ESR1 < 10%
• Crystal perturbation Spec 1: residual slope within ±50 ppb/°C; Spec 2: calculate the average peak-to-peak frequency deviation of the minor loop hysteresis 2