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MICROCHIP 1N6121A

Fabricante
N.º de pieza fab.
1N6121A
Nº LCSC
C3718670
Emb.
Through Hole,D3.6xL4.7mm
Número de Cliente
Atrib. clave
59.1VC Clamp 8.5A Ipp TVS DIODE Through Hole
Hoja de DatosMICROCHIP 1N6121A
Garantía en cada pedido
100% Auténtico · Devolución o Reemplazo en 30 Días
Agotado
Avisarme
Mínimo: 1Múltiplo: 1Unidad de venta: Piece
Añadir a la Lista BOM
Cant.Prec. unit.(Solo como referencia)Importo total
1+$ 17.5986$ 17.60
200+$ 6.8103$ 1362.06
500+$ 6.5712$ 3285.60
1,000+$ 6.4524$ 6452.40
Encapsulado Estándar1/Full Bag
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Especificaciones del Producto

Todo
TipoDescripción
CategoríaCircuit Protection/Transient Voltage Suppressors (TVS)/TVS Diodes
FabricanteMICROCHIP
Emb.Through Hole,D3.6xL4.7mm
Clamping Voltage59.1V
Operating Temperature-55℃~+175℃
Peak Pulse Current (Ipp)8.5A
Peak Pulse Power Dissipation (Ppp)500W
Voltage - Breakdown40.9V
typeTVS
Reverse Leakage Current (Ir)1uA
PolarityBidirectional
Reverse Stand-Off Voltage (Vrwm)32.7V

Descripción

Traducción por IA

This series of voidless, hermetically sealed bidirectional Transient Voltage Suppressors (TVS) is qualified to MIL-PRF-19500/516 and is ideal for high-reliability applications where a failure cannot be tolerated. They provide a Working Peak “Standoff” Voltage selection from 5.7 to 152 volts with a 500 watt rating for a 10/1000 µs pulse. They are very robust in hard-glass construction and use internal “Category r” metallurgical bonds. These devices are available as both a non-suffix part and an “A” version providing different voltage tolerances. These devices are also available in a surface mount MELF package configuration.

Características

Traducción por IA
  • High surge current and peak pulse power provides transient voltage protection for sensitive circuits.
  • Triple-layer passivation.
  • Internal “Category 1” metallurgical bonds.
  • Voidless hermetically sealed glass package.
  • JAN, JANTX, and JANTXV qualified versions are available per MIL-PRF-19500/516.
  • RoHS compliant versions available (commercial grade only).

Aplicaciones

Traducción por IA
  • High-reliability applications